Inhaltsangabe1 Line Profile Analysis: A Historical Overview.- 2 Convolution Based Profile Fitting.- 3 Whole Powder Pattern Modelling: Theory and Applications.- 4 Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems.- 5 Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement.- 6 The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass Ceramics with Different Absorption Coefficients.- 7 Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials.- 8 A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material.- 9 Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave.- 10 Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis.- 11 X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions.- 12 Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials.- 13 Line Profile Fitting: The Case of fcc Crystals Containing Stacking Faults.- 14 Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically Elastically Anisotropic Solids; The Case of Thin Films.- 15 Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements.- 16 Grain Surface Relaxation Effects in Powder Diffraction.- 17 Interface Stress in Polycrystalline Materials.- 18 Problems Related to X-Ray Stress Analysis in Thin Films in the Presence of Gradients and Texture.- 19 Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers.- 20 Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond.

Inhaltsangabe1 Line Profile Analysis: A Historical Overview.- 2 Convolution Based Profile Fitting.- 3 Whole Powder Pattern Modelling: Theory and Applications.- 4 Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systems.- 5 Crystallite Size and Residual Strain/Stress Modeling in Rietveld Refinement.- 6 The Quantitative Determination of the Crystalline and the Amorphous Content by the Rietveld Method: Application to Glass Ceramics with Different Absorption Coefficients.- 7 Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials.- 8 A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material.- 9 Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave.- 10 Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis.- 11 X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions.- 12 Determination of Non-uniform Dislocation Distributions in Polycrystalline Materials.- 13 Line Profile Fitting: The Case of fcc Crystals Containing Stacking Faults.- 14 Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically Elastically Anisotropic Solids; The Case of Thin Films.- 15 Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements.- 16 Grain Surface Relaxation Effects in Powder Diffraction.- 17 Interface Stress in Polycrystalline Materials.- 18 Problems Related to X-Ray Stress Analysis in Thin Films in the Presence of Gradients and Texture.- 19 Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers.- 20 Three-Dimensional Reciprocal Space Mapping: Application to Polycrystalline CVD Diamond.